A Genetic Approach to Detect Bridging Faults, Transitional Delay Faults and Stuck at Faults in LSI Circuits

A novel algorithm based on Genetic approach for diagnosing Bridging faults, Transitional Delay faults and stuck at faults in LSI circuits is presented. The method of devising a universal set for detecting Bridging faults in testable circuits is investigated. We outline a method that utilizes the information from the stuck-at fault model to accurately diagnose the bridging faults that affect two lines. The proposed method uses the observation that the bridging fault response matches the stuck at fault responses on the shorted lines for the failing test vectors. By using the information from the pass test vectors a further reduction in size of test set is possible. The algorithmic approach allows us to have a random search of test vectors without being caught in a local minima or maxima. The fitness scheme allows us to have a selection of test vectors with high fault coverage and with large fault detection scores.